The Centre for Interdisciplinary Research (CIR) was established by the Institute in order to promote cross-interdisciplinary research. The Centre was inaugurated by Prof. P. Chakrabarti Director, MNNIT Allahabad on 28th November 2012. In view of the dramatic developments in the field of Science and Technology research, CIR has been established in the Institute to keep pace with current cutting edge research.

One of the primary objectives of Institute is to provide best research and analytical facilities for its entire undergraduate, postgraduate, research scholars and faculty. With this vision the CIR is being established in the Institute. In addition to serving the Institute, the Centre also welcomes researchers all over the country to use the facility at nominal cost. The Centre also looks forward for collaborative research program with other leading Technical Institutions/Universities and Research laboratories. The functioning of CIR is being coordinated by a core committee and a technical committee constituted by the Director from among the faculty members of the Institute. 


Experimental facilities functioning in CIR

S.No. Name of the Equipment with details  Photograph


High Resolution X-ray diffractometer (XRD)
Model: Smart lab 3KW
Applications: RIGAKU Smartlab X-ray diffractometer is the most novel diffractometer available in CIR. Its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment.
Full automated alignment under computer control. Optional in-plane diffraction arm for in-plane measurements without reconfiguration. Focusing and parallel beam geometries without reconfiguration.
Measurable Properties

1. Crystal lattice parameters
2. Crystal orientation
3. Particle /por-size analysis
4. Nano Structural Analysis
5. Residual Stress determination
6. Thin Film analysis including:
7. Thin film thickness, density, roughness
8. Reflectivity Thickness and Roughness measurements
9. Rocking Curve and Reciprocal Space Mapping




XRD data of (002) Oriented ZnO nanorods gorwn on Si Substrate



Scanning Probe Microscopy (SPM) OR Atomic force microscopy (AFM)
Make: Agilent
Model: Agilent 5500
Applications: AFM is an imaging technique used to determine topography and other properties of surfaces. It can resolve features as small as an atomic lattice, for either conductive or non-conductive samples. The potential of AFM extends to applications in life science, materials science, electrochemistry, polymer science, biophysics, nanotechnology, and biotechnology.
Features with Agilent 5500 AFM System
• Scanning Tunneling Microscopy (STM)
• Force Modulation Microscopy (FMM)
• Lateral Force Microscopy (LFM)
• Dynamic Lateral Force Microscopy (DLFM)
• Magnetic Force Microscopy (MFM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Force Microscopy (KFM)



Pulsed Laser Deposition

Make:Quanta System DNA Laser


Model:IEC/EN 60825-1:2007


For the synthesis of oxide thin films and nanostructures


RF/ DC Sputtering System
Make: Hind High Vacuum (HHV) Co (P) Ltd
Model: PS 2000
Applications: The HHV make RF/DC magnetron sputtering unit in CIR provides complete coating solutions for the deposition of both metal and insulator on substrates providing a high level of control and uniformity.
RF/DC magnetron sputtering unit consist of turbo pumped vacuum coater with following major components:
Vacuum system and chamber, Turbo molecular pump with controller, Water cooled stainless steel chamber and door, Edwards rotary pump, 2 angstrom science flex head magnetrons, 2 in 1 out RF/ DC source selector switch, 3 inch work holder with substrate heater, Temperature controller, Triple mass flow controller for Ar, N2, O2 with isolation valves and filters, 2 kW DC power supply, 600W RF power supply



Vacuum Coating Unit
Make: Hind High Vacuum (HHV) Co (P) Ltd
Application: Versatile coating system, used to deposit thin, homogenous, uniform, pure film coatings of various metals to achieve controlled effects in applications like optics, electronics, materials, thin film coating etc.



Spectroscopic Ellipsometer VASE

Make:J.A. Wollam Co. Inc.


Application: Used for the measuring various parameters of thin films namely Optical constants, film thickness (single of multiple layers), Doping concentration, Surface and interfacial roughness etc.




Fluorescence Spectrometer
Make: Perkin Elmer,
Model: LS-45
Applications: Used in various application like fluorescence, phosphorescence, chemi - or bioluminescence.


Scanning Tunnelling Microscope(STM)

Make:Quazar Technologies



Used for imaging surfaces at the atomic level.

Highly Oriented Pyrolytic Graphite Image


Semiconductor Device Analyser

Make:Agilent Technologies



Mainly for device Characterizations


Measurement capabilities
• Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 µV - 200 V
• AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities
• Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)
• Up to 40 V high voltage pulse forcing for non-volatile memory evaluation



Programmable Spin Coater

Make:APEX Instruments

Model:Spin NXG-P2


Spin coating is used for many applications where relatively flat substrates or objects are coated with thin layers of material.


Scanning Electron Microscopy (SEM) with Micro universal testing machine (Micro UTM) 


Model:  EVO MA 5


Micro Test 5000W Tensile Stage Module: 5000 N load cell
Applications: To conduct Tensile and compression tests of Nanocomposites, composites, metals, polymers, etc. at room temperature.



Ultra Pure Water Purification System (Milli-Q)


Model:  Integral 3


• Pure and ultrapure water is available directly from tap water (no need to have a DI source in the lab) from 60 L/day up to 350 L/day (depending on model)
• Consistent production of superior quality pure water (better than twice the quality of distilled water) without the need to regenerate a DI tank, thanks to patented Elix technology
• Easy pure or ultrapure water delivery in different lab locations thanks to the PODs
• Easy and intuitive operation
• Application-specific water qualities through customized final polishers
• Built-in resistivity and TOC monitors designed to comply with the most demanding norms, including USP requirements


Name:Electrochemical Analyzer



Applications: Used for most of the standard electrochemical applications. In combination with the powerful NOVA software Autolab PGSTAT can be used for most of the standard electrochemical techniques.
Key features:
Electrode connections:2, 3 and 4
Potential range: +/- 10 V
Compliance voltage:+/- 10 V
Maximum current:+/- 100 mA
Current ranges:10 mA to 10 nA
Potential accuracy:+/- 0.2 %
Potential resolution:3 µV
Current accuracy:+/- 0.2 %
Current resolution:0.0003 % (of current range)
Input impedance:> 100 GOhm
Potentiostat bandwidth:1 MHz.



B. In addition to the above, some more highly sophisticated equipments namely Optical Table, Particle Size Analyser (Microtrac), Thin Film Deposition System, Three Stack Furnace, 3.0 Tesla Cryofree VSM, are in the process of shipment and will be installed shortly.
C. The facilities created in CIR have been extensively used by the B.Tech, M.Tech. Ph.D. Students and faculty members of different Departments since their installation

D. Patents filed
Application No.2332/DEL/2014 A] INDIA
Date of filing of Application :16/08/2014
Publication Date : 24/10/2014
Name of Inventor : 1)P. Chakrabarti and 2)Aditi Srivastava

E. CIR has also contributed for the publication of following research papers
1. Sumit Vyas, Kumar Shubham, Rohit Tiwary and P. Chakrabarti, "Study the Target effect on the Structural, Surface and Optical properties of TiO2 Thin Film Fabricated by RF Sputtering Method", In Press, Accepted Manuscript in Superlaticess and Microstructures , Available online 15 November 2014.
2. Shashikant Sharma, Sumit Vyas, C. Periasamy and P. Chakrabarti, “Structural and optical characterization of ZnO thin films for optoelectronic device applications by RF sputtering technique” Volume 75, November 2014, Pages 378–389, Superlattices and Microstructures.
3. Pushpa Giri, Chhaya , Sumit Vyas and P. Chakrabarti, “Comparative studies on the Characteristics of ZnO thin films deposited by single-step and two step method using RF-sputtering”, Presented in International Conference on Devices, Circuits and Communications , September 12-13, 2014, BIT Mesra
4. Sumit Vyas, Rohit Tiwary, Kumar Shubham and P. Chakrabarti, “Characterization of TiO2 thin films by RF-sputtering method”, Presented in International Conference on Devices, Circuits and Communications, September 12-13, 2014, BIT Mesra
5. Sumit Vyas, Shaivalini Singh and P. Chakrabarti, “Deposition and Characterization of as‐deposited ZnO Thin Films by Thermal Evaporation Method”, Presented in 3rd Global Conference on Materials Science and Engineering (CMSE 2014), Oct 20-23, Shanghai
6. Pushpa Giri, Chhaya Narayan, Sumit Vyas, and P. Chakrabarti, “Fabrication and Characterization of ZnO Nanorods/Pd-Au Contacts” Presented in 3rd Global Conference on Materials Science and Engineering (CMSE 2014), Oct 20-23, Shanghai
7. Sushant Singh, Naresh Kumar, Aashish Jha, Mohit Sahni, Kil-dong Sung, J. H. Jung, and S. Chaubey “Study of magnetic, dielectric and magnetodielectric properties of BaTiO3/Fe3O4 core/shell nanocomposite”, Journal of Materials Science: Materials in Electronics, 10.1007/s10854-014-2358-4, (2014) .
8. Mohit Sahni , Naresh Kumar, Sushant Singh, Aashish Jha, S. Chaubey, Manoj Kumar, and M. K. Sharma “Influence of Mn doping on structural, electrical and magnetic properties of (0.90)BiFeO3–(0.10)BaTiO3 composite”, Journal of Materials Science: Materials in Electronics, 25 (5), 2199-2209, (2014).
9. Sushant Singh, Naresh Kumar, Richa Bhargava, Mohit Sahni, Kil-dong Sung, and J.H. Jung “Magnetodielectric effect in BaTiO3/ZnFe2O4 core/shell nanoparticles”, Journal of Alloys and Compounds 587 437–441 (2014).
10. Jyotsna Kailashiya, Nitesh Singh, Sunil K. Singh Vikas Agrawal, Debabrata Dash “Graphene oxide-based biosensor for detection of platelet-derived microparticles: A potential tool for thrombus risk identification” , Biosensors and Bioelectronics 65, 274–280 (2015).
11. Mohit Sahni, Naresh Kumar, Manoj Kumar, Sushant Singh, Aashish Jha and S. Chaubey “Effect of Sr substitution on structural, dielectric, magnetic and magnetoelectric properties of rapid liquid sintered BiFe0.8Ti0.2O3 ceramics”; Abstract accepted for presentation in an International Conference on Multifunctional Materials, Structures & Applications (ICMMSA–2014) is being organised at MNNIT Allahabad, India in collaboration with the University of Missouri (MU), Columbia, USA during Dec 22-24, 2014.
12. Sushant Singh, Naresh Kumar, Mohit Sahni, Aashish Jha, Amit Srivastava, S. Chaubey, “Influence of substrate temperature and oxygen pressure on the structural, morphological and magnetic properties of PLD grown ZnFe2O4 thin films”; Abstract accepted for presentation in an International Conference on Multifunctional Materials, Structures & Applications (ICMMSA–2014) is being organised at MNNIT Allahabad, India in collaboration with the University of Missouri (MU), Columbia, USA during Dec 22-24, 2014.
13. Amit Srivastava, Ashish Jha, Sushant Singh & Naresh Kumar, “Catalyst free growth of ZnO nanorods using pulsed laser deposition” Abstract accepted for presentation in an International Conference on Multifunctional Materials, Structures & Applications (ICMMSA–2014) is being organised at MNNIT Allahabad, India in collaboration with the University of Missouri (MU), Columbia, USA during Dec 22-24, 2014.